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Model 10 (dc to 11 GHz )
面议4051A/B/C/D/E–S系列信号/频谱分析仪
面议3656A矢量网络分析仪
面议1435A/B/C/D/F 信号发生器
面议1465C/D/F/H/L信号发生器
面议3672A/B/C/D/E矢量网络分析仪
面议1441系列信号发生器
面议Model 140(90 to 140 GHz / WR-8 waveguide input)
面议铁电压电分析仪 TF Analyzer 3000
面议铁电压电分析仪 TF Analyzer 2000E
面议铁电压电分析仪 TF Analyzer 1000
面议FS-Pro半导体参数测试仪
面议The GGB Industries, Inc., line of DIFFERENTIAL CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip.
The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected. The GGB Industries, Inc., line of calibration substrates is such a standard.
Each calibration substrate contains highly precise elements for calibrating out the unavoidable errors and losses in a microwave network analyzer, its associated cabling, and the microwave probe to ensure accurate on-wafer testing.
Our accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to precisely calibrate the measurement system to the probe tips.
The typical elements for calibrating a microwave measurement system consists of opens, shorts, 50 ohm loads, and throughs. Our precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results.
All load standards are individually inspected and trimmed to within 0.25% accuracy using NIST traceable equipment.
Easy to use step by step instructions are provided for use with Agilent ENA four port network analyzers and Agilent PNA network analyzers with PLTS software.
SOLT = Short-Open-Load-Through
LRL = Line-Reflect-Line
LRM = Line-Reflect-Match